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IEEE Transactions on Emerging Topics in Computing Special Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems JULY 1st DEADLINE APPROACHING |
CALL FOR PAPERS |
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IEEE Transactions on Emerging Topics in Computing (TETC) seeks original manuscripts for a Special Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in future VLSI systems. This special session is a follow up of the IEEE VLSI Test Symposium 2019 addressing the main topics discussed during the conference. All aspects of design, manufacturing, test, monitoring and securing of systems affected by defects and malicious attacks are of interest. The relevant topics for this special section include, but are not limited to:
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Submissions |
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Submitted papers must include a new significant research-based technical contribution. The submitted papers must include a clear evaluation of the proposed solutions (based on simulation and/or implementations results) and comparisons to state-of-the-art solutions. Extended versions of published conference papers are welcome but there must be at least 40% of new impacting technical/scientific material in the submitted manuscript. As an author, you are responsible for understanding and adhering to the submission guidelines. Please thoroughly read these before submitting your manuscript. Please submit your paper to Manuscript Central at https://mc.manuscriptcentral.com/tetc-cs. While submitting through ScholarOne, please select the option “Special Section on Emerging Trends and Computing Paradigms for Testing, Reliability and Security in Future VLSI Systems.” | |
Key Dates |
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Deadline for submissions: July 1, 2019 |
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| Additional Information | |
Guest editors: Stefano Di Carlo (Politecnico di Torino, Italy) For additional information please send an email to tetc.sivlsitest@gmail.com. Papers under review elsewhere are not acceptable for submission. |
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| For more information, visit us on the web at: http://bit.do/eQwx5 |
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This special issue is linked with the 37th IEEE VLSI Test Symposium 2019 that is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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Computer Society-Test Technology Technical Council |
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